Experimental-Modeling Framework for Identifying Defects Responsible for Reliability Issues in 2D FETs

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Authors: Luca Panarella, Stanislav Tyaginov, Ben Kaczer, Quentin Smets, Devin Verreck, Alexander Makarov, Tom Schram, Dennis Lin, César Javier Lockhart de la Rosa, Gouri S. Kar, Valeri Afanas’ev

Journal title: ACS Applied Materials & Interfaces

Journal number: 16

Journal publisher: American Chemical Society

Published year: 2024

Published pages: 62314-62325

DOI identifier: 10.1021/acsami.4c10888

ISSN: 1944-8244