Evidence of contact-induced variability in industrially-fabricated highly-scaled MoS2 FETs

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Authors: Luca Panarella, Ben Kaczer, Quentin Smets, Stanislav Tyaginov, Pablo Saraza Canflanca, Andrea Vici, Devin Verreck, Tom Schram, Dennis Lin, Theresia Knobloch, Tibor Grasser, César Lockhart de la Rosa, Gouri S. Kar, Valeri Afanas’ev

Journal title: npj 2D Materials and Applications

Journal number: 8

Journal publisher: Nature Portfolio

Published year: 2024

DOI identifier: 10.1038/s41699-024-00482-9

ISSN: 2397-7132