Understanding Causalities in Organic Photovoltaics Device Degradation in a Machine-Learning-Driven High-Throughput Platform

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Authors: Chao Liu, Larry Lüer, Vincent M. Le Corre, Karen Forberich, Paul Weitz, Thomas Heumüller, Xiaoyan Du, Jonas Wortmann, Jiyun Zhang, Jerrit Wagner, Lei Ying, Jens Hauch, Ning Li, Christoph J. Brabec

Journal title: Advanced Materials

Journal number: 36

Journal publisher: Wiley

Published year: 2023

Published pages: 2300259

DOI identifier: 10.1002/adma.202300259

ISSN: 1521-4095