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Authors: Tom Shaked, Karen Lee Bar-Sinai, Ari Meles-Braverman, Oren Elmakis, Amir Degani
Journal title: IEEE Access
Journal number: 11
Journal publisher: Institute of Electrical and Electronics Engineers Inc.
Published year: 2024
Published pages: 118841-118848
DOI identifier: 10.1109/access.2023.3327112
ISSN: 2169-3536