Quantum efficiency measurement and modeling of silicon sensors optimized for soft X-ray detection

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Authors: Carulla M, Barten R, Baruffaldi F, Bergamaschi A, Borghi G, Boscardin M, Brückner M, Butcher TA, Centis Vignali M, Dinapoli R, Ebner S, Ficorella F, Fröjdh E, Greiffenberg D, Hammad Ali O, Hasanaj S, Heymes J, Hinger V, King T, Kozlowski P, Lopez Cuenca C, Mezza D, Moustakas K, Mozzanica A, Paternoster G, Paton KA, Ronchin S, Ruder C, Schmitt B, Sieberer P, Thattil D, Vog

Journal title: Sensors

Journal publisher: Multidisciplinary Digital Publishing Institute (MDPI)

Published year: 2024

DOI identifier: 10.3390/s24030942

ISSN: 1424-8220