Investigating the effect of approximate multipliers on the resilience of a systolic array DNN accelerator

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Authors: Pappalardo, Salvatore; Piri, Ali; Ruospo, Annachiara; O'Connor, Ian; Deveautour, Bastien; Sanchez, Ernesto; Bosio, Alberto

Journal title: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)

Journal publisher: IEEE

Published year: 2023

DOI identifier: 10.1109/dft59622.2023.10313535

ISBN: 979-8-3503-1500-4