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Authors: Mirsalari, Seyed Ahmad; Tagliavini, Giuseppe; Rossi, Davide; Benini, Luca
Journal title: Design, Automation & Test in Europe Conference & Exhibition (DATE)
Journal publisher: IEEE
Published year: 2023
DOI identifier: 10.23919/date56975.2023.10136916
ISBN: 979-8-3503-9624-9