Hyperspectral microscopy as a particle exposure assessment tool

Summary

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Authors: C. Blanch-Perez-del-Notario, P. Bertier, M. Jayapala and A. Lambrechts

Journal title: SPIE Photonics West 2024 Proceedings

Journal publisher: SPIE

Published year: 2024

DOI identifier: 10.1117/12.3002829