Testbeam results of irradiated SiGe BiCMOS monolithic silicon pixel detector without internal gain layer

Summary

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Authors: T. Moretti, M. Milanesio, R. Cardella, T. Kugathasan, A. Picardi, I. Semendyaev, M. Elviretti, H. Rücker, K. Nakamura, Y. Takubo, M. Togawa, F. Cadoux, R. Cardarelli, L. Cecconi, S. Débieux, Y. Favre, C.A. Fenoglio, D. Ferrere, S. Gonzalez-Sevilla, L. Iodice, R. Kotitsa, C. Magliocca, M. Nessi, A. Pizarro-Medina, J. Sabater Iglesias, J. Saidi, M. Vicente Barreto Pinto, S. Zambito, L. Paolozzi, G

Journal title: Journal of Instrumentation

Journal number: 19

Journal publisher: Institute of Physics

Published year: 2024

Published pages: P07036

DOI identifier: 10.1088/1748-0221/19/07/p07036

ISSN: 1748-0221