Radiation tolerance of SiGe BiCMOS monolithic silicon pixel detectors without internal gain layer

Summary

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: M. Milanesio, L. Paolozzi, T. Moretti, R. Cardella, T. Kugathasan, F. Martinelli, A. Picardi, I. Semendyaev, S. Zambito, K. Nakamura, Y. Takubo, M. Togawa, M. Elviretti, H. Rücker, F. Cadoux, R. Cardarelli, S. Débieux, Y. Favre, C.A. Fenoglio, D. Ferrere, S. Gonzalez-Sevilla, L. Iodice, R. Kotitsa, C. Magliocca, M. Nessi, A. Pizarro-Medina, J. Sabater Iglesias, J. Saidi, M. Vicente Barreto Pinto

Journal title: Journal of Instrumentation

Journal number: 19

Journal publisher: Institute of Physics

Published year: 2024

Published pages: P01014

DOI identifier: 10.1088/1748-0221/19/01/p01014

ISSN: 1748-0221