VULGEN: Realistic Vulnerability Generation Via Pattern Mining and Deep Learning

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Authors: Yu Nong, Yuzhe Ou, Michael Pradel, Feng Chen, Haipeng Cai

Journal title: 2023 IEEE/ACM 45th International Conference on Software Engineering (ICSE)

Journal publisher: IEEE

Published year: 2023

Published pages: 2527-2539

DOI identifier: 10.1109/icse48619.2023.00211