Large-Scale Statistical Analysis of Defect Emission in hBN: Revealing Spectral Families and Influence of Flake Morphology

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Authors: Md Samiul Islam, Rup Kumar Chowdhury, Marie Barthelemy, Loic Moczko, Pascal Hebraud, Stephane Berciaud, Alberto Barsella, Francois Fras

Journal title: ACS Nano

Journal number: 18

Journal publisher: American Chemical Society

Published year: 2024

Published pages: 20980-20989

DOI identifier: 10.1021/acsnano.3c10403

ISSN: 1936-0851