A Critical Re-evaluation of Benchmark Datasets for (Deep) Learning-Based Matching Algorithms

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Authors: George Papadakis, Nishadi Kirielle, Peter Christen, Themis Palpanas

Journal title: IEEE International Conference on Data Engineering (ICDE)

Journal publisher: IEEE

Published year: 2024

DOI identifier: 10.48550/arXiv.2307.01231