Virtual Experience Toolkit: Enhancing 3D Scene Virtualization From Real Environments Through Computer Vision and Deep Learning Techniques

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Authors: Clara Garcia, Pau Mora, Mario Ortega, Eugenio Ivorra, Gaetano Valenza, Mariano L. Alcaiz

Journal title: 2023 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE)

Journal publisher: IEEE

Published year: 2024

Published pages: 694-699

DOI identifier: 10.1109/metroxraine58569.2023.10405757