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Authors: Gaetano Valenza, Mariano Alcaniz, Antonio Luca Alfeo, Matteo Bianchi, Vladimir Carli, Vincenzo Catrambone, Mario CGA Cimino, Gabriela Dudnik, Andrea Duggento, Matteo Ferrante, Claudio Gentili, Jaime Guixeres, Simone Rossi, Nicola Toschi, Virginie van Wassenhove
Journal title: 2023 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE)
Journal publisher: IEEE
Published year: 2024
Published pages: 757-762
DOI identifier: 10.1109/metroxraine58569.2023.10405613