Slip localization and grain boundary sliding analysis at sub-voxel resolution using phase contrast tomography

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Authors: Pedro Damas Resende, Damien Texier, Julien Genée, Malo Jullien, Henry Proudhon, Julien Réthoré, Didier Bardel, Wolfgang Ludwig

Journal title: Tomography of Materials and Structures

Journal number: 2025

Journal publisher: Elevier B.V.

Published year: 2025

Published pages: 100060

DOI identifier: 10.1016/j.tmater.2025.100060

ISSN: 2949-673X