Neural Network for the Prediction of Electric Field Intensity Applied to a Simple Scenario

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Authors: Sebastian Mauricio Salas Laurens, Jean David Bertaux, Anne Roc’h

Journal title: 2024 IEEE Joint International Symposium on Electromagnetic Compatibility, Signal & Power Integrity: EMC Japan / Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Japan/APEMC Okinawa)

Journal publisher: IEEE

Published year: 2024

Published pages: 702-705

DOI identifier: 10.23919/emcjapan/apemcokinaw58965.2024.10584958