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Authors: S. V. Dilip Kumar, Josep Balasch, Benedikt Gierlichs, Ingrid Verbauwhede
Journal title: IEEE Transactions on Information Forensics and Security
Journal number: 20
Journal publisher: Institute of Electrical and Electronics Engineers (IEEE)
Published year: 2025
DOI identifier: 10.1109/TIFS.2025.3541442
ISSN: 1556-6013