Security and Ethics Readiness Levels: Two New Scales

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Authors: Laurynas Adomaitis, Björn Hoog, Alexei Grinbaum

Journal title: 2024 IEEE International Conference on Technology Management, Operations and Decisions (ICTMOD)

Journal publisher: IEEE

Published year: 2025

DOI identifier: 10.1109/ICTMOD63116.2024.10878193