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Authors: A. R. Ynineb, H. Farbakhsh, G. Ben Othman, Y. Wahlquist, I. R. Birs, E. Yumuk, C. I. Muresan, R. De Keyser, D. Copot, C. M. Ionescu, M. Neckebroek
Journal title: 2024 European Control Conference (ECC)
Journal publisher: IEEE
Published year: 2024
DOI identifier: 10.23919/ECC64448.2024.10590766