Loss and decoherence in superconducting circuits on silicon: Insights from electron spin resonance

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Authors: Jayaraman A., Danilov A.V., Bylander J. and Kubatkin S.E.

Journal title: Physical Review Applied

Journal number: 1

Journal publisher: Americal Physical Society (APS)

Published year: 2024

DOI identifier: 10.48550/ARXIV.2402.03889

ISSN: 2331-7019