MTJ degradation in multi-pillar SOT-MRAM with selective writing

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: Simon Van Beek, Kaiming Cai, Kaiquan Fan, Giacomo Talmelli, Anna Trovato, Nico Jossart, Siddharth Rao, Adrian Chasin, Sebastien Couet

Journal title: 2023 IEEE International Reliability Physics Symposium (IRPS)

Journal publisher: IEEE

Published year: 2023

Published pages: 1-7

DOI identifier: 10.1109/irps48203.2023.10117917