Mission Profile-Oriented Reliability Assessment of a GaN-based On-Board Charger

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Authors: Sachin Kumar Bhoi, Olcay Bay, Farzad Hosseinabadi, Sajib Chakraborty ,Omar Hegazy

Journal title: 47th Workshop on Compound Semiconductor Devices and Integrated Circuits held in Europe and 18th Expert Evaluation and Control of Compound Semiconductor Materials and Technologies

Journal publisher: WOCSDICE-EXMATEC 2024

Published year: 2024