A 3-level Active Gate Driver Network for SiC MOSFETs to Minimize Overshoot and Switching Losses

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Authors: Vin Loong Choo, Martin Pfost

Journal title: 2024 IEEE Applied Power Electronics Conference and Exposition (APEC)

Journal publisher: IEEE

Published year: 2024

Published pages: 2794-2799

DOI identifier: 10.1109/apec48139.2024.10509175