Surface defect identification using Bayesian filtering on a 3D mesh

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Authors: Matteo Dalle Vedove, Matteo Bonetto, Edoardo Lamon, Luigi Palopoli, Matteo Saveriano, Daniele Fontanelli

Journal title: Measurement: Sensors

Journal publisher: Elsevier BV

Published year: 2025

DOI identifier: 10.1016/J.MEASEN.2025.101849

ISSN: 2665-9174