Joint Metrics for EMF Exposure and Coverage in Real-World Homogeneous and Inhomogeneous Cellular Networks

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Authors: Quentin Gontier, Charles Wiame, Shanshan Wang, Marco Di Renzo, Joe Wiart, François Horlin, Christo Tsigros, Claude Oestges, Philippe De Doncker

Journal title: IEEE Transactions on Wireless Communications

Journal number: 23

Journal publisher: IEEE

Published year: 2024

DOI identifier: 10.1109/TWC.2024.3400612