Symmetry and planar chirality measured with a log-polar transformation in a transmission electron microscope

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Authors: A.H. Tavabi, P. Rosi, R.B.G. Ravelli, A. Gijsbers, E. Rotunno, T. Guner, Y. Zhang, A. Roncaglia, L. Belsito, G. Pozzi, T. Denneulin, G.C. Gazzadi, M. Ghosh, R. Nijland, S. Frabboni, P.J. Peters, E. Karimi, P. Tiemeijer, R.E. Dunin-Borkowski, V. Grillo

Journal title: Physical Review Applied

Journal number: 22

Journal publisher: American Physical Society (APS)

Published year: 2024

DOI identifier: 10.1103/physrevapplied.22.014083

ISSN: 2331-7019