Neutron Radiation Tests of the NEORV32 RISC-V SoC on Flash-Based FPGAs

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Authors: Kevin Böhmer, Bruno Forlin, Carlo Cazzaniga, Paolo Rech, Gianluca Furano, Nikolaos Alachiotis, Marco Ottavi

Journal title: 2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)

Journal publisher: IEEE

Published year: 2024

DOI identifier: 10.1109/DFT59622.2023.10313556