Summary
This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.
Authors: Tijmen T. Smit, Bruno Endres Forlin, Kuan-Hsun Chen, Ioanna Souvatzoglou, Mihalis Psarakis, Marco Ottavi
Journal title: 2024 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
Journal publisher: IEEE
Published year: 2024
DOI identifier: 10.1109/DFT63277.2024.10753564
Search
Associated projects
Organisations
- Not specified