Fundamental Aspects of Conduction in Charged ErMnO<sub>3</sub> Domain Walls

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Authors: James McCartan, Patrick W. Turner, James P. V. McConville, Kristina Holsgrove, Charlotte Cochard, Amit Kumar, Raymond G. P. McQuaid, Dennis Meier, J. Marty Gregg

Journal title: Advanced Electronic Materials

Journal number: 10

Journal publisher: Wiley

Published year: 2024

DOI identifier: 10.1002/aelm.202400091

ISSN: 2199-160X