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Authors: Luca Beber, Edoardo Lamon, Giacomo Moretti, Matteo Saveriano, Luca Fambri, Luigi Palopoli, Daniele Fontanelli
Journal title: IEEE Transactions on Instrumentation and Measurement
Journal number: 74
Journal publisher: Institute of Electrical and Electronics Engineers (IEEE)
Published year: 2025
DOI identifier: 10.1109/TIM.2025.3581663
ISSN: 0018-9456