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Authors: G. Roelkens, J. Zhang, A. De Groote, J. Juvert, N. Ye, S. Kumari, J. Goyvaerts, G. Muliuk, S. Uvin, G. Chen, B. Haq, B. Snyder, J. Van Campenhout, D. Van Thourhout, A. J. Trindade, C.A. Bower, J. O'Callaghan, R. Loi, B. Roycroft, B. Corbett
Journal title: 2018 IEEE Optical Interconnects Conference (OI)
Journal publisher: IEEE
Published year: 2018
Published pages: 13-14
DOI identifier: 10.1109/oic.2018.8422030
ISBN: 978-1-5386-5352-4