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Authors: L. Bogaerts, Z. El-Mekki, S. Van Huylenbroeck, P. Nolmans, N. Pantano, X. Sun, M. Rakowski, D. Velenis, P. Verheyen, S. Balakrishnan, P. De Heyn, B. Snyder, Y. Ban, S. Srinivasan, S. Lardenois, J. De Coster, M. Detalle, P. Absil, A. Miller, M. Pantouvaki, J. Van Campenhout
Journal title: 2018 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S)
Journal publisher: IEEE
Published year: 2018
Published pages: 1-3
DOI identifier: 10.1109/s3s.2018.8640164
ISBN: 978-1-5386-7627-1