Data-driven and Event-driven Integration Architecture for Plant-wide Industrial Process Monitoring and Control

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: David Hastbacka, Petri Kannisto, Matti Vilkko

Journal title: IECON 2018 - 44th Annual Conference of the IEEE Industrial Electronics Society

Journal publisher: IEEE

Published year: 2018

Published pages: 2979-2985

DOI identifier: 10.1109/iecon.2018.8591323

ISBN: 978-1-5090-6684-1